Abstract: The destructive testing for reliability analysis at high-power microwave (HPM) in the GaAs/InGaP hetero-junction bipolar transistor (HBT) has been rarely investigated although it has a ...
According to MarketsandMarkets, the services NDT and inspection market is expected to grow from USD 11.41 billion in 2025 to USD 17.31 billion by 2030, at a CAGR of 8.7% from 2025 to 2030. Browse 150 ...
According to MarketsandMarkets, the services NDT and inspection market is expected to grow from USD 11.41 billion in 2025 to ...
Abstract: This paper focuses on the detection of hole-like de-fects in materials using non-destructive testing methods. The proposed approach utilizes perturbances in induced eddy currents, captured ...
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